2449 search results - page 396 / 490 » VLSI |
116
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ICCD
2007
IEEE
16 years 1 months ago
2007
IEEE
As the VLSI technology marches beyond 65 and 45nm process technologies, variation in gate length has a direct impact on leakage and performance of CMOS transistors. Due to sub-wav...
192
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ICCD
2005
IEEE
16 years 1 months ago
2005
IEEE
Increasingly significant power/ground supply voltage degradation in nanometer VLSI designs leads to system performance degradation and even malfunction. Existing techniques focus...
126
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ICCD
2003
IEEE
16 years 1 months ago
2003
IEEE
- This paper presents a precomputation-based guarding technique to reduce both dynamic and static power consumptions in CMOS VLSI circuits. More precisely, a high threshold sleep t...
131
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ICCD
2003
IEEE
16 years 1 months ago
2003
IEEE
DNA probe arrays have recently emerged as one of the core genomic technologies. Exploiting analogies between manufacturing processes for DNA arrays and for VLSI chips, we demonstr...
142
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ICCD
2002
IEEE
16 years 1 months ago
2002
IEEE
We represent switching activity in VLSI circuits using a graphical probabilistic model based on Cascaded Bayesian Networks (CBN’s). We develop an elegant method for maintaining ...