2449 search results - page 398 / 490 » VLSI |
133
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ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
As CMOS technology scales into the nanometer regime, power dissipation and associated thermal concerns in high-performance ICs due to on-chip hot-spots and thermal gradients are b...
163
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ICCAD
2005
IEEE
16 years 1 months ago
2005
IEEE
A priori wirelength estimation is concerned with predicting various wirelength characteristics before placement. In this work we propose a novel, accurate estimator of net lengths...
112
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ICCAD
2005
IEEE
16 years 1 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...
ICCAD
2004
IEEE
16 years 1 months ago
2004
IEEE
To ensure the power and signal integrity of modern VLSI circuits, it is crucial to analyze huge amount of nonlinear devices together with enormous interconnect and even substrate ...
137
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ICCAD
2003
IEEE
16 years 1 months ago
2003
IEEE
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...