2449 search results - page 399 / 490 » VLSI |
117
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ICCAD
2002
IEEE
16 years 1 months ago
2002
IEEE
As the VLSI technology scaling down, the electromigration problem becomes one of the major concerns in high-performance IC design for both power network and signal interconnects. ...
134
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ICCAD
2002
IEEE
16 years 1 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
102
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ICCAD
2001
IEEE
16 years 1 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
121
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ISPD
2010
ACM
15 years 11 months ago
2010
ACM
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...
127
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ISPD
2010
ACM
15 years 11 months ago
2010
ACM
This paper presents SafeChoice (SC), a novel clustering algorithm for wirelength-driven placement. Unlike all previous approaches, SC is proposed based on a fundamental theorem, s...