2449 search results - page 400 / 490 » VLSI |
117
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ISPD
2010
ACM
15 years 11 months ago
2010
ACM
As the thermal wall becomes the dominant factor limiting VLSI circuit performance, and the interconnect wires become the primary power consumer, power efficiency of onchip data th...
127
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DAC
2009
ACM
15 years 11 months ago
2009
ACM
For a computing system to be trusted, it is equally important to verify that the system performs no more and no less functionalities than desired. Traditional testing and verifica...
125
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CP
2009
Springer
15 years 11 months ago
2009
Springer
Abstract. VLSI chips design is becoming increasingly complex and calling for more and more automation. Many chip design problems can be formulated naturally as constraint problems ...
129
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DFT
2009
IEEE
15 years 11 months ago
2009
IEEE
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
127
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DFT
2009
IEEE
15 years 11 months ago
2009
IEEE
This paper presents a study of errors that occur in DNA self-assembly using synthesized tile sets for template manufacturing. It is shown that due to the reduced size, aggregates ...