2449 search results - page 407 / 490 » VLSI |
133
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VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
118
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ASAP
2007
IEEE
15 years 10 months ago
2007
IEEE
With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip and multicore architect...
133
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry....
131
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
147
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
Many side-channel attacks on implementations of cryptographic algorithms have been developed in recent years demonstrating the ease of extracting the secret key. In response, vari...