2449 search results - page 408 / 490 » VLSI |
117
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
113
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
The network-on-chip (NoC) paradigm is seen as a way of facilitating the integration of a large number of computational and storage blocks on a chip to meet several performance and...
121
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
107
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
118
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FCCM
2007
IEEE
15 years 10 months ago
2007
IEEE
A new platform for reconfigurable computing has an object-based programming model, with architecture, silicon and tools designed to faithfully realize this model. The platform is ...