2449 search results - page 429 / 490 » VLSI |
117
Voted
DATE
2003
IEEE
15 years 9 months ago
2003
IEEE
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
111
Voted
DFT
2003
IEEE
15 years 9 months ago
2003
IEEE
In the last years, new requirements in terms of vehicle performance increased significantly the amount of on-board electronics, thus raising more concern about safety and fault to...
120
Voted
DFT
2003
IEEE
15 years 9 months ago
2003
IEEE
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
125
Voted
DFT
2003
IEEE
15 years 9 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
136
Voted
DFT
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper discusses a hybrid optoelectronic scheme for a new interconnection network, "Tori connected mESHes (TESH)". The major features of TESH are the following: it i...