2449 search results - page 460 / 490 » VLSI |
DAC
2002
ACM
15 years 10 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
91
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DAC
2003
ACM
15 years 10 months ago
2003
ACM
Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC netw...
101
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DAC
2003
ACM
15 years 10 months ago
2003
ACM
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...
DAC
2004
ACM
15 years 10 months ago
2004
ACM
As technology advances, the metal width is decreasing with the length increasing, making the resistance along the power line increase substantially. Together with the nonlinear sc...
74
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DAC
2006
ACM
15 years 10 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...