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AMC
2007
92views more  AMC 2007»
15 years 7 hour ago
An integrated framework for continuous assessment and improvement of manufacturing systems
This paper presents an integrated framework for assessment and ranking of manufacturing systems based on management and organizational performance indicators. The integrated appro...
Ali Azadeh, S. F. Ghaderi, Y. Partovi Miran, V. Eb...
BMCBI
2006
148views more  BMCBI 2006»
14 years 12 months ago
Exploiting the full power of temporal gene expression profiling through a new statistical test: Application to the analysis of m
Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...
Veronica Vinciotti, Xiaohui Liu, Rolf Turk, Emile ...
ICCAD
2002
IEEE
176views Hardware» more  ICCAD 2002»
15 years 8 months ago
High capacity and automatic functional extraction tool for industrial VLSI circuit designs
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
Sasha Novakovsky, Shy Shyman, Ziyad Hanna
NOCS
2007
IEEE
15 years 6 months ago
NoC Design and Implementation in 65nm Technology
As embedded computing evolves towards ever more powerful architectures, the challenge of properly interconnecting large numbers of on-chip computation blocks is becoming prominent...
Antonio Pullini, Federico Angiolini, Paolo Meloni,...
PLDI
2006
ACM
15 years 5 months ago
Correctness-preserving derivation of concurrent garbage collection algorithms
Constructing correct concurrent garbage collection algorithms is notoriously hard. Numerous such algorithms have been proposed, implemented, and deployed – and yet the relations...
Martin T. Vechev, Eran Yahav, David F. Bacon