ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
Although they focus on the big picture, high level supply chain models cannot gloss over the capacity of production nodes to meet production allocations. Capacity is not simply a ...
Abstract. We present a technique and a tool for model-checking operational UML models based on a mapping of object oriented UML models into a framework of communicating extended ti...
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...