363 search results - page 35 / 73 » Validation coverage analysis for complex digital designs |
MTDT
2003
IEEE
15 years 3 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
106
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DAC
2003
ACM
15 years 10 months ago
2003
ACM
This paper considers the role of performance and area estimates from behavioral synthesis in design space exploration. We have developed a compilation system that automatically ma...
ISLPED
2003
ACM
15 years 3 months ago
2003
ACM
Ever shrinking device sizes and innovative micro-architectural and circuit design techniques have made it possible to have multi-million transistor systems running at multi-gigahe...
100
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DAC
2010
ACM
14 years 10 months ago
2010
ACM
Given the increasing complexity of multi-processor systems-onchip, a wide range of parameters must be tuned to find the best trade-offs in terms of the selected system figures of ...
RECOMB
2004
Springer
15 years 10 months ago
2004
Springer
The challenge of similarity search in massive DNA sequence databases has inspired major changes in BLAST-style alignment tools, which accelerate search by inspecting only pairs of...