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119
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ICCD
2006
IEEE
16 years 1 months ago
2006
IEEE
— In this paper, we present a comprehensive energy estimation framework for software executing on Very Long Instruction Word (VLIW) processor cores. The proposed energy model is ...
ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
140
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ICCAD
2003
IEEE
16 years 1 months ago
2003
IEEE
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
134
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ICCAD
2001
IEEE
16 years 1 months ago
2001
IEEE
Dynamic voltage scaling (DVS) is a technique that varies the supply voltage and clock frequency based on the computation load to provide desired performance with the minimal amoun...
135
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ISPASS
2010
IEEE
15 years 11 months ago
2010
IEEE
Continuous circuit miniaturization and increased process variability point to a future with diminishing returns from dynamic voltage scaling. Operation below Vcc-min has been prop...