1192 search results - page 105 / 239 » Variation-Aware Fault Modeling |
183
Voted
DAC
2006
ACM
16 years 4 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
149
Voted
DAC
2006
ACM
15 years 5 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
135
Voted
ICCAD
2007
IEEE
16 years 16 days ago
2007
IEEE
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
106
Voted
ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...
127
Voted
ETS
2006
IEEE
15 years 9 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...