1192 search results - page 115 / 239 » Variation-Aware Fault Modeling |
135
Voted
ICCD
2008
IEEE
16 years 19 days ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
137
Voted
ISCA
2007
IEEE
15 years 10 months ago
2007
IEEE
High availability is an increasingly important requirement for enterprise systems, often valued more than performance. Systems designed for high availability typically use redunda...
131
Voted
DSN
2006
IEEE
15 years 9 months ago
2006
IEEE
The Solaris 10 Operating System includes a number of new features for predictive self-healing. One such feature is the ability of the Fault Management software to diagnose memory ...
116
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
157
Voted
SRDS
1993
IEEE
15 years 7 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...