Failures triggered by hard to debug defects usually involve complex interactions between many program elements. We hypothesize that information flows present a good model for such ...
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
—This paper considers the problem of temporally fusing classifier outputs to improve the overall diagnostic classification accuracy in safety-critical systems. Here, we discuss d...
Process monitoring refers to the task of detecting abnormal process operations resulting from the shift in the mean and/or the variance of one or more process variables. To success...
—Topology control problems are concerned with the assignment of power levels to the nodes of an ad-hoc network so as to maintain a specified network topology while minimizing th...