Abstract. Current paper proposes an efficient alternative for traditional gatelevel fault simulation. The authors explain how Structurally Synthesized Binary Decision Diagrams (SSB...
Jaan Raik, Raimund Ubar, Sergei Devadze, Artur Jut...
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
We present an algorithm based on temporal-epistemic model checking combined with fault injection to analyse automatically the diagnosability of faults by agents in the system. We d...
Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses s...
David B. Lavo, Brian Chess, Tracy Larrabee, F. Joe...