1192 search results - page 136 / 239 » Variation-Aware Fault Modeling |
114
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ISCA
2007
IEEE
15 years 10 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
139
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IPPS
2006
IEEE
15 years 9 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...
139
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PTS
1993
15 years 5 months ago
1993
In the area of testing communication systems, the interfaces between systems to be tested and their testers have great impact on test generation and fault detectability. Several t...
136
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NDSS
2006
IEEE
15 years 9 months ago
2006
IEEE
Software monocultures are usually considered dangerous because their size and uniformity represent the potential for costly and widespread damage. The emerging concept of collabor...
138
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DSN
2004
IEEE
15 years 7 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...