This paper discusses the problems of pin-level fault injection for dependability validation and presents the architecture of a pin-level fault injector called RIFLE. This system ca...
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transie...
Ramtilak Vemu, Abhijit Jas, Jacob A. Abraham, Srin...
- By putting different chips on the same mask, shuttle mask (or multiple project wafer) provides an economical solution for low volume designs and design prototypes to share the ri...
Gang Xu, Ruiqi Tian, David Z. Pan, Martin D. F. Wo...
Effective discrimination between transient and permanent faults is a very important practical problem in (dependable) system design. A count-andthreshold mechanism named -count, d...
Fabrizio Grandoni 0002, Andrea Bondavalli, Silvano...