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ATS
2009
IEEE
117views Hardware» more  ATS 2009»
15 years 10 months ago
N-distinguishing Tests for Enhanced Defect Diagnosis
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith...
KI
2009
Springer
15 years 10 months ago
Constraint-Based Integration of Plan Tracking and Prognosis for Autonomous Production
Today’s complex production systems allow to simultaneously build different products following individual production plans. Such plans may fail due to component faults or unfores...
Paul Maier, Martin Sachenbacher, Thomas Rühr,...
MIDDLEWARE
2009
Springer
15 years 10 months ago
Why Do Upgrades Fail and What Can We Do about It?
Abstract. Enterprise-system upgrades are unreliable and often produce downtime or data-loss. Errors in the upgrade procedure, such as broken dependencies, constitute the leading ca...
Tudor Dumitras, Priya Narasimhan
VTS
2007
IEEE
95views Hardware» more  VTS 2007»
15 years 10 months ago
Delay Test Quality Evaluation Using Bounded Gate Delays
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
Soumitra Bose, Vishwani D. Agrawal
VLSID
2005
IEEE
120views VLSI» more  VLSID 2005»
15 years 9 months ago
On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...