1192 search results - page 148 / 239 » Variation-Aware Fault Modeling |
143
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ICCD
2003
IEEE
15 years 9 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
136
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PPDP
2000
Springer
15 years 7 months ago
2000
Springer
Identifying the source of space faults in functional programs is hard. The problem is compoundedas space usage can vary enormously from one implementation to another. We use a ter...
152
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JOT
2010
15 years 2 months ago
2010
Abstract We propose a novel testing technique for object-oriented programs. Based on the state and activity models of a system, we construct an intermediate representation, which w...
153
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EVOW
2001
Springer
15 years 8 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
125
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ISQED
2007
IEEE
15 years 10 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...