1192 search results - page 155 / 239 » Variation-Aware Fault Modeling |
155
click to vote
HPCA
2006
IEEE
16 years 4 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
153
click to vote
CODES
2009
IEEE
15 years 10 months ago
2009
IEEE
Time redundancy (rollback-recovery) and hardware redundancy are commonly used in real-time systems to achieve fault tolerance. From an energy consumption point of view, time redun...
147
click to vote
ISCA
2005
IEEE
15 years 9 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
236
click to vote
SAC
2008
ACM
15 years 3 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
123
click to vote
SPAA
2003
ACM
15 years 9 months ago
2003
ACM
The general problem of verifying coherence for shared-memory multiprocessor executions is NP-Complete. Verifying memory consistency models is therefore NP-Hard, because memory con...