This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...
Domain-partition (DP) model is a general model for reliability maximization problem under given redundancy. In this paper, an improved DP model is used to formulate a reconfigurati...
Although program faults are widely studied, there are many aspects of faults that we still do not understand, particularly about OO software. In addition to the simple fact that o...
To improve the whole dependability of large-scale cluster systems, an online fault detection mechanism is proposed in this paper. This mechanism can detect the fault in time befor...