1192 search results - page 175 / 239 » Variation-Aware Fault Modeling |
142
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ITC
1998
IEEE
15 years 8 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
143
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SP
1998
IEEE
15 years 8 months ago
1998
IEEE
This paper presents results from analyzing the vulnerability of security-critical software applications to malicious threats and anomalous events using an automated fault injectio...
125
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ATVA
2006
Springer
15 years 7 months ago
2006
Springer
Abstract. Since testing is inherently incomplete, test selection is of vital importance. Coverage measures evaluate the quality of a test suite and help the tester select test case...
161
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MICRO
2006
IEEE
15 years 4 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
138
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ICST
2009
IEEE
15 years 10 months ago
2009
IEEE
GEGICK, MICHAEL CHARLES. Predicting Attack-prone Components with Source Code Static Analyzers. (Under the direction of Laurie Williams). No single vulnerability detection techniqu...