1192 search results - page 223 / 239 » Variation-Aware Fault Modeling |
132
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VLSID
2006
IEEE
15 years 9 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
131
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PDCAT
2005
Springer
15 years 8 months ago
2005
Springer
Recently a bulk of research [14, 5, 15, 9] has been done on the modelling of the smallworld phenomenon, which has been shown to be pervasive in social and nature networks, and eng...
144
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DEDS
2002
15 years 3 months ago
2002
Abstract. Detection and isolation of failures in large and complex systems such as telecommunication networks are crucial and challenging tasks. The problem considered here is that...
111
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ATAL
2003
Springer
15 years 8 months ago
2003
Springer
In a large distributed system it is often infeasible or even impossible to perform diagnosis using a single model of the whole system. Instead, several spatially distributed local...
123
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CONSTRAINTS
2007
15 years 3 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...