1192 search results - page 35 / 239 » Variation-Aware Fault Modeling |
107
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DFT
2005
IEEE
15 years 9 months ago
2005
IEEE
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
114
Voted
ISMVL
2007
IEEE
15 years 9 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
122
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ISSTA
2004
ACM
15 years 8 months ago
2004
ACM
The ability to predict which files in a large software system are most likely to contain the largest numbers of faults in the next release can be a very valuable asset. To accomp...
114
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DATE
1998
IEEE
15 years 7 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
128
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BCS
2008
15 years 4 months ago
2008
Using formal verification for designing hardware designs free from logic design bugs has been an active area of research since the last 15 years. Technology has matured and we hav...