Since counterexamples generated by model checking tools are only symptoms of faults in the model, a significant amount of manual work is required in order to locate the fault that...
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
Abstract--The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete schem...
— Most state-based approaches to fault diagnosis of discrete-event systems require a complete and accurate model of the system to be diagnosed. In this paper, we address the prob...
— Large Clusters, high availability clusters and Grid deployments often suffer from network, node or operating system faults and thus require the use of fault tolerant programmin...