1192 search results - page 6 / 239 » Variation-Aware Fault Modeling |
VTS
2003
IEEE
15 years 2 months ago
2003
IEEE
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establi...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
DFT
2003
IEEE
15 years 2 months ago
2003
IEEE
This paper proposes a new fault model and its modeling and analysis methods in a clockless asynchronous wave pipeline for extensive yield evaluation and assurance. It is highly de...
DFT
2003
IEEE
15 years 2 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...