When a program P fails to satisfy a requirement R supposedly ensured by a detailed speci cation S that was used to implement P, there is a question about whether the problem arise...
Karthikeyan Bhargavan, Carl A. Gunter, Davor Obrad...
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
Static analysis is a tremendous help when trying to find faults in complex software. Writing multi-threaded programs is difficult, because the thread scheduling increases the prog...