This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
In this paper faults are processed and models of faults in telecommunications networks are proposed in relation to services and revenues. The probability of faults occurring is es...
Okuthe P. Kogeda, Johnson I. Agbinya, Christian W....
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
The ability to guarantee that a system will continue to operate correctly under degraded conditions is key to the success of adopting multi-agent systems (MAS) as a paradigm for d...