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ISSRE
2008
IEEE
15 years 3 months ago
The Effect of the Number of Defects on Estimates Produced by Capture-Recapture Models
Project managers use inspection data as input to capture-recapture (CR) models to estimate the total number of faults present in a software artifact. The CR models use the number ...
Gursimran Singh Walia, Jeffrey C. Carver
104
Voted
SENSYS
2010
ACM
14 years 7 months ago
Efficient diagnostic tracing for wireless sensor networks
Wireless sensor networks (WSNs) are hard to program due to unconventional programming models used to satisfy stringent resource constraints. The common event-driven concurrent pro...
Vinaitheerthan Sundaram, Patrick Th. Eugster, Xian...
ISCA
2011
IEEE
270views Hardware» more  ISCA 2011»
14 years 1 months ago
Sampling + DMR: practical and low-overhead permanent fault detection
With technology scaling, manufacture-time and in-field permanent faults are becoming a fundamental problem. Multi-core architectures with spares can tolerate them by detecting an...
Shuou Nomura, Matthew D. Sinclair, Chen-Han Ho, Ve...
ATS
2003
IEEE
87views Hardware» more  ATS 2003»
15 years 2 months ago
March SL: A Test For All Static Linked Memory Faults
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mik...
71
Voted
JCO
2008
85views more  JCO 2008»
14 years 9 months ago
Locating and detecting arrays for interaction faults
The identification of interaction faults in component-based systems has focussed on indicating the presence of faults, rather than their location and magnitude. While this is a va...
Charles J. Colbourn, Daniel W. McClary