3 search results - page 1 / 1 » Variation-aware placement for FPGAs with multi-cycle statist... |
ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
FPGA
2010
ACM
14 years 7 months ago
2010
ACM
Deep submicron processes have allowed FPGAs to grow in complexity and speed. However, such technology scaling has caused FPGAs to become more susceptible to the effects of process...
FPGA
2007
ACM
14 years 4 months ago
2007
ACM
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. ASIC designers have adopted statistical optimization techniques to mitigate the e...