226 search results - page 20 / 46 » Variation-tolerant circuits: circuit solutions and technique... |
ISQED
2007
IEEE
15 years 4 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
ICCAD
2009
IEEE
14 years 7 months ago
2009
IEEE
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
ICES
2000
Springer
15 years 1 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
DAC
2005
ACM
15 years 10 months ago
2005
ACM
In this paper we present a system level technique for mapping large, multiple-IP-block designs to channel-width constrained FPGAs. Most FPGA clustering tools [2, 3, 11] aim to red...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
The simulation of on-chip inductance using PEEC-based circuit analysis methods often requires the solution of a subproblem where an extracted inductance matrix must be multiplied ...