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» Variation-tolerant circuits: circuit solutions and technique...
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ISLPED
1997
ACM
94views Hardware» more  ISLPED 1997»
15 years 1 months ago
A gate resizing technique for high reduction in power consumption
With the advent of portable and high density microelectronic devices, the power dissipation of VLSI circuits is becoming a critical concern. In this paper, we propose a post
Patrick Girard, Christian Landrault, Serge Pravoss...
72
Voted
DFT
2003
IEEE
117views VLSI» more  DFT 2003»
15 years 3 months ago
Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
Sobeeh Almukhaizim, Yiorgos Makris
DAC
1994
ACM
15 years 1 months ago
Clock Grouping: A Low Cost DFT Methodology for Delay Testing
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Wen-Chang Fang, Sandeep K. Gupta
EH
2004
IEEE
107views Hardware» more  EH 2004»
15 years 1 months ago
Evolving Digital Circuits using Multi Expression Programming
Multi Expression Programming (MEP) is a Genetic Programming (GP) variant that uses linear chromosomes for solution encoding. A unique MEP feature is its ability of encoding multipl...
Mihai Oltean, Crina Grosan
71
Voted
ISPD
1999
ACM
94views Hardware» more  ISPD 1999»
15 years 2 months ago
Gate sizing with controlled displacement
- In this paper, we present an algorithm for gate sizing with controlled displacement to improve the overall circuit timing. We use a path-based delay model to capture the timing c...
Wei Chen, Cheng-Ta Hsieh, Massoud Pedram