849 search results - page 12 / 170 » Variational methods for the Dirichlet process |
UAI
2008
14 years 11 months ago
2008
Exemplar-based clustering methods have been shown to produce state-of-the-art results on a number of synthetic and real-world clustering problems. They are appealing because they ...
ASPDAC
2004
ACM
15 years 2 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
ASPDAC
2007
ACM
15 years 1 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
ICIP
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper the blind image deconvolution (BID) problem is solved using the Bayesian framework. In order to find the parameters of the proposed Bayesian model we present a new g...
JMLR
2010
14 years 4 months ago
2010
Interest in multioutput kernel methods is increasing, whether under the guise of multitask learning, multisensor networks or structured output data. From the Gaussian process pers...