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SIAMIS
2011
14 years 6 months ago
Large Scale Bayesian Inference and Experimental Design for Sparse Linear Models
Abstract. Many problems of low-level computer vision and image processing, such as denoising, deconvolution, tomographic reconstruction or superresolution, can be addressed by maxi...
Matthias W. Seeger, Hannes Nickisch
ICCAD
2003
IEEE
175views Hardware» more  ICCAD 2003»
15 years 8 months ago
Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abhishek Singh, Jitin Tharian, Jim Plusquellic
DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 4 months ago
Aging-resilient design of pipelined architectures using novel detection and correction circuits
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Hamed F. Dadgour, Kaustav Banerjee
DAC
2007
ACM
15 years 3 months ago
Statistical Framework for Technology-Model-Product Co-Design and Convergence
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...
BMCBI
2006
99views more  BMCBI 2006»
14 years 12 months ago
A proposed metric for assessing the measurement quality of individual microarrays
Background: High-density microarray technology is increasingly applied to study gene expression levels on a large scale. Microarray experiments rely on several critical steps that...
Kyoungmi Kim, Grier P. Page, T. Mark Beasley, Step...