Abstract. Many problems of low-level computer vision and image processing, such as denoising, deconvolution, tomographic reconstruction or superresolution, can be addressed by maxi...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...
Background: High-density microarray technology is increasingly applied to study gene expression levels on a large scale. Microarray experiments rely on several critical steps that...
Kyoungmi Kim, Grier P. Page, T. Mark Beasley, Step...