Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
Embedded computing architectures can be designed to meet a variety of application specific requirements. However, optimized hardware can require compiler support to realize the po...
We present a robust anisotropic dense disparity estimation algorithm which employs perceptual maximum variation modeling. Edge-preserving dense disparity vectors are estimated usi...
With continuing scaling of CMOS process, process variations in the form of die-to-die and within-die variations become significant which cause timing uncertainty. This paper prop...
We address the problem of variational optical flow for video processing applications that need fast operation and robustness to drastic variations in illumination. Recently, a sol...