849 search results - page 50 / 170 » Variational methods for the Dirichlet process |
102
click to vote
DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
103
click to vote
BIB
2007
15 years 2 months ago
2007
Bayesian methods are valuable, inter alia, whenever there is a need to extract information from data that is uncertain or subject to any kind of error or noise (including measurem...
108
click to vote
ICIP
2005
IEEE
16 years 3 months ago
2005
IEEE
In this paper, a multi-view face pose classification method is introduced. Each face region is normalized by two eye-centers and mouth center, and then multi-class classifiers are...
153
click to vote
ASPDAC
2008
ACM
15 years 4 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
112
click to vote
ICIP
2009
IEEE
16 years 3 months ago
2009
IEEE
In this paper, we propose a novel motion vector processing approach based on the temporal analysis of motion vector reliability for motion-compensated frame interpolation. We firs...