5348 search results - page 699 / 1070 » Variational surface modeling |
174
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
166
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ISQED
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
140
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ISQED
2007
IEEE
16 years 20 days ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
176
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VTC
2007
IEEE
16 years 20 days ago
2007
IEEE
Provision of mobile broadband wireless access, for instance via high altitude platforms (HAPs) to the passengers on a high-speed train, requires the development of efficient and r...
157
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VTS
2007
IEEE
16 years 20 days ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...