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133
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VLSID
2002
IEEE
122views VLSI» more  VLSID 2002»
16 years 4 months ago
Evaluating Run-Time Techniques for Leakage Power Reduction
While some leakage power reduction techniques require modification of process technology achieving savings at the fabrication stage, others are based on circuit-level optimization...
David Duarte, Yuh-Fang Tsai, Narayanan Vijaykrishn...
120
Voted
SIGMOD
2003
ACM
111views Database» more  SIGMOD 2003»
16 years 3 months ago
Extended Wavelets for Multiple Measures
While work in recent years has demonstrated that wavelets can be efficiently used to compress large quantities of data and provide fast and fairly accurate answers to queries, lit...
Antonios Deligiannakis, Nick Roussopoulos
124
Voted
EUROSYS
2006
ACM
16 years 24 days ago
Automated known problem diagnosis with event traces
Computer problem diagnosis remains a serious challenge to users and support professionals. Traditional troubleshooting methods relying heavily on human intervention make the proce...
Chun Yuan, Ni Lao, Ji-Rong Wen, Jiwei Li, Zheng Zh...
129
Voted
ICCD
2004
IEEE
138views Hardware» more  ICCD 2004»
16 years 19 days ago
Design and Implementation of Scalable Low-Power Montgomery Multiplier
In this paper, an efficient Montgomery multiplier is introduced for the modular exponentiation operation, which is fundamental to numerous public-key cryptosystems. Four aspects a...
Hee-Kwan Son, Sang-Geun Oh
133
Voted
ICCAD
2003
IEEE
127views Hardware» more  ICCAD 2003»
16 years 18 days ago
Layout-Aware Scan Chain Synthesis for Improved Path Delay Fault Coverage
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
Puneet Gupta, Andrew B. Kahng, Ion I. Mandoiu, Pun...