19 search results - page 2 / 4 » Verification-guided soft error resilience |
CORR
2006
Springer
14 years 9 months ago
2006
Springer
Abstract-- Variable length codes (VLCs) exhibit desynchronization problems when transmitted over noisy channels. Trellis decoding techniques based on Maximum A Posteriori (MAP) est...
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can...
DSN
2008
IEEE
15 years 4 months ago
2008
IEEE
Many classes of applications are inherently tolerant to errors. One such class are applications designed for a human end user, where the capabilities of the human cognitive system...
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PATMOS
2007
Springer
15 years 3 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
PRDC
2006
IEEE
15 years 3 months ago
2006
IEEE
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...