19 search results - page 3 / 4 » Verification-guided soft error resilience |
ASPLOS
2010
ACM
15 years 4 months ago
2010
ACM
Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individ...
HPCA
2009
IEEE
15 years 4 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
MICRO
2008
IEEE
15 years 4 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ICDCS
2005
IEEE
15 years 3 months ago
2005
IEEE
The process of computing the physical locations of nodes in a wireless sensor network is known as localization. Selflocalization is critical for large-scale sensor networks becaus...