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» Verifying VLSI Circuits
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GLVLSI
2007
IEEE
140views VLSI» more  GLVLSI 2007»
15 years 4 months ago
Structured and tuned array generation (STAG) for high-performance random logic
Regularly structured design techniques can combat complexity on a variety of fronts. We present the Structured and Tuned Array Generation (STAG) design methodology, which provides...
Matthew M. Ziegler, Gary S. Ditlow, Stephen V. Kos...
VLSI
2007
Springer
15 years 4 months ago
Impact of hardware emulation on the verification quality improvement
— Software simulation remains the most used method for VHDL RTL functional verification. The functional verification process essentially consists of two parts. The first one is t...
Youssef Serrestou, Vincent Beroulle, Chantal Robac...
GLVLSI
2005
IEEE
147views VLSI» more  GLVLSI 2005»
15 years 3 months ago
1-V 7-mW dual-band fast-locked frequency synthesizer
This paper presents a fully integrated 1-V, dual band, fastlocked frequency synthesizer for IEEE 802.11 a/b/g WLAN applications. It can synthesize frequencies in the range of 2.4 ...
Vikas Sharma, Chien-Liang Chen, Chung-Ping Chen
GLVLSI
2003
IEEE
175views VLSI» more  GLVLSI 2003»
15 years 3 months ago
A custom FPGA for the simulation of gene regulatory networks
We present a unique FPGA that uses a mix of digital and large-signal analog computation for the simulation of gene regulatory networks. The prototype IC consists of a 4x5 array of...
Ilias Tagkopoulos, Charles A. Zukowski, German Cav...
VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 2 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal