1093 search results - page 137 / 219 » Verifying VLSI Circuits |
106
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VLSID
2009
IEEE
16 years 1 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
119
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VLSID
2007
IEEE
16 years 1 months ago
2007
IEEE
In the past, Field Programmable Gate Array (FPGA) circuits only contained a limited amount of logic and operated at a low frequency. Few applications running on FPGAs consumed exc...
93
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ICCAD
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
120
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ICCAD
1995
IEEE
15 years 4 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
DAC
2006
ACM
16 years 1 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...