1093 search results - page 185 / 219 » Verifying VLSI Circuits |
66
Voted
VLSID
2005
IEEE
15 years 10 months ago
2005
IEEE
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
In this paper we present statistical timing driven hMetisbased partitioning. We approach timing driven partitioning from a different perspective: we use the statistical timing cri...
VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
We propose a non-intrusive methodology for concurrent fault detection in FSMs. The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor ...
VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
There is an increasing need for obtaining a reasonably accurate estimate of energy dissipation in SoC designs. Array structures have a significant contribution to the total system...