1093 search results - page 23 / 219 » Verifying VLSI Circuits |
ICCAD
1994
IEEE
15 years 4 months ago
1994
IEEE
In this paper, we study the area-balanced multi-way partitioning problem of VLSI circuits based on a new dual netlist representation named the hybrid dual netlist (HDN), and propo...
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ENGL
2007
14 years 11 months ago
2007
— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel metho...
DAC
1995
ACM
15 years 3 months ago
1995
ACM
Abstract We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, sligh...
DAC
1995
ACM
15 years 3 months ago
1995
ACM
With the advent of portable and high-density microelectronic devices, the power dissipation of integrated circuits has become a critical concern. Accurate and e cient power estimat...
ICCAD
2000
IEEE
15 years 4 months ago
2000
IEEE
In this paper, we present simulation techniques to estimate the worst-case voltage variation using a RC model for the power distribution network. Pattern independent maximum envel...