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» Verifying VLSI Circuits
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ICCAD
1996
IEEE
93views Hardware» more  ICCAD 1996»
15 years 1 months ago
ACV: an arithmetic circuit verifier
Yirng-An Chen, Randal E. Bryant

Publication
576views
16 years 9 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
VLSID
2004
IEEE
75views VLSI» more  VLSID 2004»
15 years 10 months ago
Quantitative Model for Thermal Behaviour of an Analog Integrated Circuit
Gagandeep S. Sandha, Pawan K. Singh, C. Pradeep Ku...