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IPCV
2007
15 years 5 months ago
Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights
- The shrunk dimension of electronic devices leads to more stringent requirement on process control and quality assurance of their fabrication. For instance, direct die-to-die bond...
Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. ...
131
Voted
IAAI
2003
15 years 5 months ago
Teachable Agents: Learning by Teaching Environments for Science Domains
The crisis in science education and the need for innovative computer-based learning environments has prompted us to develop a multi-agent system, Betty’s Brain that implements t...
Krittaya Leelawong, Karun Viswanath, Joan M. Davis...
USENIX
2004
15 years 5 months ago
EmStar: A Software Environment for Developing and Deploying Wireless Sensor Networks
Many Wireless Sensor Network (WSN) applications are composed of a mixture of deployed devices with varying capabilities, from extremely constrained 8-bit "Motes" to less...
Lewis Girod, Jeremy Elson, Alberto Cerpa, Thanos S...
134
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GRAPHICSINTERFACE
2000
15 years 5 months ago
Effects of Gaze on Multiparty Mediated Communication
We evaluated effects of gaze directional and other non-verbal visual cues on multiparty mediated communication. Groups of three participants (two actors, one subject) solved langu...
Roel Vertegaal, Gerrit C. van der Veer, Harro Vons
IQ
2000
15 years 5 months ago
IP-MAP: Representing the Manufacture of an Information Product
Organizations have recognized the need for high quality information and academics have proposed several methods to measure and improve information quality. One such method is to m...
Ganesan Shankaranarayanan, Richard Y. Wang, Mostap...
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