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113
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DAC
2005
ACM
15 years 1 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
100
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CIVR
2008
Springer
15 years 1 months ago
2008
Springer
We describe a novel approach to identifying specific settings in large collections of passively captured images corresponding to a visual diary. An algorithm developed for setting...
108
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ECCV
2008
Springer
15 years 1 months ago
2008
Springer
We present a novel method for unsupervised classification, including the discovery of a new category and precise object and part localization. Given a set of unlabelled images, som...
EKAW
2008
Springer
15 years 1 months ago
2008
Springer
With the advent of the Web and the efforts towards a Semantic Web the nature of knowledge engineering has changed drastically. In this position paper we propose four principles fo...
ASUNAM
2010
IEEE
15 years 1 months ago
2010
IEEE
Problem resolution is a key issue in the IT service industry. A large service provider handles, on daily basis, thousands of tickets that report various types of problems from its...