38 search results - page 3 / 8 » Within-die Process Variations: How Accurately can They Be St... |
99
Voted
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
126
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CVPR
2009
IEEE
15 years 7 months ago
2009
IEEE
In this paper we revisit the process of constructing a high resolution 3D morphable model of face shape variation. We demonstrate how the statistical tools of thin-plate splines a...
142
Voted
PE
2010
Springer
14 years 10 months ago
2010
Springer
We propose a trace fitting algorithm for Markovian Arrival Processes (MAPs) that can capture statistics of any order of interarrival times between measured events. By studying re...
98
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WSC
2008
15 years 2 months ago
2008
In this tutorial we present techniques for building valid and credible simulation models. Ideas to be discussed include the importance of a definitive problem formulation, discuss...
105
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PATMOS
2007
Springer
15 years 6 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...