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ICCAD
2006
IEEE
127views Hardware» more  ICCAD 2006»
15 years 10 months ago
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
IEICET
2007
73views more  IEICET 2007»
15 years 1 months ago
An ON-OFF Multi-Rate Loss Model of Finite Sources
Bursty traffic is dominant in modern communication networks and keeps the call-level QoS assessment an open issue. ON-OFF traffic models are commonly used to describe bursty tra...
Ioannis D. Moscholios, Michael D. Logothetis, Mich...
DAC
2011
ACM
14 years 1 months ago
Understanding the impact of power loss on flash memory
Flash memory is quickly becoming a common component in computer systems ranging from music players to mission-critical server systems. As flash plays a more important role, data ...
Hung-Wei Tseng, Laura M. Grupp, Steven Swanson
KDD
2009
ACM
156views Data Mining» more  KDD 2009»
16 years 2 months ago
Effective multi-label active learning for text classification
Labeling text data is quite time-consuming but essential for automatic text classification. Especially, manually creating multiple labels for each document may become impractical ...
Bishan Yang, Jian-Tao Sun, Tengjiao Wang, Zheng Ch...
INFOCOM
1997
IEEE
15 years 6 months ago
VBR over VBR: The Homogeneous, Loss-Free Case
We consider the multiplexing of several variable bit rate (VBR) connections over one variable bit rate connection where the multiplexing uses a multiplexing bu er of size B. The V...
Silvia Giordano, Jean-Yves Le Boudec, Philippe Oec...