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ICCAD
2006
IEEE
127views Hardware» more  ICCAD 2006»
15 years 6 months ago
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
IEICET
2007
73views more  IEICET 2007»
14 years 10 months ago
An ON-OFF Multi-Rate Loss Model of Finite Sources
Bursty traffic is dominant in modern communication networks and keeps the call-level QoS assessment an open issue. ON-OFF traffic models are commonly used to describe bursty tra...
Ioannis D. Moscholios, Michael D. Logothetis, Mich...
DAC
2011
ACM
13 years 9 months ago
Understanding the impact of power loss on flash memory
Flash memory is quickly becoming a common component in computer systems ranging from music players to mission-critical server systems. As flash plays a more important role, data ...
Hung-Wei Tseng, Laura M. Grupp, Steven Swanson
KDD
2009
ACM
156views Data Mining» more  KDD 2009»
15 years 10 months ago
Effective multi-label active learning for text classification
Labeling text data is quite time-consuming but essential for automatic text classification. Especially, manually creating multiple labels for each document may become impractical ...
Bishan Yang, Jian-Tao Sun, Tengjiao Wang, Zheng Ch...
INFOCOM
1997
IEEE
15 years 2 months ago
VBR over VBR: The Homogeneous, Loss-Free Case
We consider the multiplexing of several variable bit rate (VBR) connections over one variable bit rate connection where the multiplexing uses a multiplexing bu er of size B. The V...
Silvia Giordano, Jean-Yves Le Boudec, Philippe Oec...